- failure (of a beam)
- Сахалин А: потеря несущей способности (бимса)
Универсальный англо-русский словарь. Академик.ру. 2011.
failure (of a beam)
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Failure analysis — is the process of collecting and analyzing data to determine the cause of a failure. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of… … Wikipedia
Failure of Engineer Garin — ( ru. Крах инженера Гарина, translit. Krakh inzhenera Garina ) is a Soviet 1973 television film in four parts loosely based on a novel Hyperboloid of Engineer Garin («Гиперболоид инженера Гарина») by Alexei Tolstoy. Directed by Leonid Kvinikhidze … Wikipedia
Failure — For other uses, see Failure (disambiguation). Fail redirects here. For the Irish Republican Party, see Fianna Fáil … Wikipedia
Failure — (Roget s Thesaurus) < N PARAG:Failure >N GRP: N 1 Sgm: N 1 failure failure Sgm: N 1 nonsuccess nonsuccess nonfulfillment Sgm: N 1 dead failure dead failure successlessness Sgm: N 1 abortion abortion miscarriage Sgm: N 1 b … English dictionary for students
I-beam — I beams (also known as W beams or double T esp. in Polish and German) are beams with an I or H shaped cross section ( W stands for wide flange ). The horizontal elements are flanges, while the vertical element is the web. The Euler Bernoulli beam … Wikipedia
Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… … Wikipedia
Balance beam — The balance beam is an artistic gymnastics apparatus, as well as the event performed using the apparatus. Both the apparatus and the event are sometimes referred to as simply beam . The English abbreviation for the event in gymnastics scoring is… … Wikipedia
Ion beam — An ion beam is a type of particle beam consisting of ions. Ion beams have many uses in electronics manufacturing (principally ion implantation) and other industries. Today s ion beam sources are typically derived from the mercury vapor thrusters… … Wikipedia
Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… … Wikipedia
Electron Beam Prober — The Electron Beam Prober (E beam Prober) is a specialized adaption of a standard Scanning Electron Microscope (SEM) that is used for semiconductor failure analysis. While a standard SEM may be operated in a voltage range of 25KeV to 30KeV, the E… … Wikipedia
Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… … Wikipedia
